PCIe SSD Tester

Neosem Technology is a world leader in PCIe SSD testing. With our innovative architecture and signaling infrastructure we are able to provide a high integrity device interface that covers multi-lane Gen 3.0 performance even when your test needs require 1024 drives tested in parallel, at elevated temperature being interfaced to one of our chambers.

The growing adoption of the new PCIe SSD drive technology,  Low latency and high densities, are factors that requires from Neosem Technology to continually reinvent its SSD storage test systems in order to stay ahead of industry needs.

SSD manufacturer have an immediate need for a test system that is able to test SSDs as standard generic drives, but to also test for unique SSD drive failure modes and attributes of the underlying solid state technology. Building on its more than two decades history of developing Memory testers, Neosem Technology is introducing a wide array of products designed specifically for SSDs.

Key Features and Optionssx4-t-with-cover

  • Supports SSD  Burn-IN and SSD Functional Testing
  • Support various SSD Protocol and Speed
  • Comprehensive library of production test scripts, specially designed for SSD drives.
  • Easy removal of  SSD devices from Test boards
  • Damage‐proof insertion on Test boards
  • Easy to switch from PCIe to SATA/SAS by quick change of Test board
  • Supports Neosem DNA3 integrated software platform.
  • Hot swappable  test SSD devices.
  • Automatic detection of SSD devices.
  • Production Test floor efficiency

SX Series DNA3 Software

  • Intuitive script programming for developing test routines.
  • Extensive API for user-defined plug-ins.
  • Extensive library of test routines.
  • Easy to navigate GUI
  • User friendly management tools

Applications

  • Factory production testing.
  • Qualification/Certification.
  • QA/Reliability testing.
  • SSD Device screening

System Description

This Neosem SX3/SX4 test system is based on a high density system footprint that can accommodate a minimum of 128 devices (DUTs) up to 1024 SSD devices. Industry standard PCIe‐bus interfaces are supported. As new generations of interfaces and protocols are defined, Neoem will be ready with upgrade options to keep the system future‐proof. This tester supports the robust Neosem ‘s DNA3 test‐software platform with a comprehensive library of standard tests, while allowing user-defined and user-developed test scripts through a provided script development platform. Many options are available to support test needs tailored to customer requirements.

sx4-t-pc

Test Options

  • SSD Device Read/Write
  • Power margining.
  • Current measurement
  • Power Cycling
  • Controller firmware download
  • Full Protocol Functional Testing

The SX3/SX4 family of production test systems are designed to be a highly parallel, high performance, low cost and scalable test solution specific for SSD Products. The SX3/SX4 production test system supports the parallel testing of a large number of SSD Drives at full protocol speeds, while supporting the higher device power requirements these latest generation SSD drives have.

Its flexibility and scalability allows multiples of sixty-four (64) SSD Drives of any Package/Protocol type to be tested in parallel. The SX3/SX4 production test systems use Neosem’s revolutionary TB/Tray technology to load and manage product for test.

With a variety of models, its configurability and scalability the SX4 is the product of choice for Quality Assurance, Ambient Production test, Engineering Development and High Volume elevated temperature manufacturing.  If you would like to learn more about the SX3/SX4 and what it can do to meet your SAS 12G, SATA 6G, or PCIe Gen 2.0/3.0 SSD test challenges.

DOWNLOAD SX3/SX4 SSD Tester Brochure (1MB)

Contact Us

Neosem Technology (Austin)
11001 Lakeline Blvd.,
Bldg I, Suite 150
Austin, TX 78717
(512) 257-5000


Neosem Technology (San Jose)
1965 Concourse Dr.,
San Jose, CA 95131
(408) 643-7000
sales@neosemtech.com