Tanisys to unveil new SATA SAS PCIe SSD High Volume Production Tester

Posted by on Friday, August 1st, 2014 in SSD TESTING

Tanisys to launch 3rd Generation SATA SSD Tester

Tanisys Technology Inc  is proud to announce the latest 3rd generation PCIe SSD Test Solution.

Tanisys SX3-t SSD tester series is a new platform dedicated to test PCIe 2.0, PCIe 3.0,AHCI, NVMe, SATA 3/6GBs & SAS 3/6/12GBs with a quick change of Test Boards.

64 DUT SX3 supporting SAS 12Gbs SSD.

64 DUT SX3 supporting SAS 12Gbs SSD.

The Tanisys SX3-t SSD Tester is designed to be a highly parallel, high performance and scalable test solutions for SSD products. The SX3t Tester supports a large number of SSD drives to be tested in parallel at their highest bandwidth speeds.

With different Test Board ( TB) , the Tanisys SX3-t tester can test any new protocols as it emerges and it fully supports Out-of -Band testing requirement. This features allow SSD Test Engineers with the ability to drive standard and proprietary DUT control signals for features such as DevSlp, firmware downloads and serial communications ( i.e SMBus,I2C,UART,etc)

Some of the Tanisys SX3-t SSD Tester Key Features

– Support : PCIe 2.0 , PCIe 3.0, SATA 3/6 Gbs, SAS 3/6/12 Gbs, AHCI and NVMe
– Support Form Factors : Edge Card FHFL, FHHL, HHFL,HHHL
– Support Form Factors : 1.8″,1.5″,SFF,mSATA & NGFF(M.2)
– Hot Plug Integrated removable Test Board
– Removable Tray System and Carrier System
– Test Up to 1024 DUTs
– Interface to Tanisys Production Chambers @ -40 to 85 C
– Integrate with Optional Oakgate Software ( Available end August 2014)

The Tanisys SX3-t SSD test solution are targeted at the 1st Tier SSD manufacturers such as Intel, Micron, Samsung, SK Hynix, Sandisk, HGST and more.

The Tanisys SX3-t SSD Tester is available for immediate ordering and Mid June 2014 Delivery and prices starts as low as US$70,000.

Download the Tanisys SX3-t SSD Tester from this link:

http://www.neosemtech.com/wp-content/uploads/2014/03/SX3t-product-catalog.pdf

Call (512) 257-5000 for more information or visit www.neosemtech.com
Founded in 1992, Tanisys Technology Inc develops, market, and support a family of high performance and cost effective SSD Storage and Flash memory test system. Tanisys pioneered the first low cost ATE Class SSD tester in 2011. Since then, Tanisys SSD testers have become the standard for SSD and Flash manufacturing industry, holding more marketshare in SSD testers than any competitions.

With its wide range of product lines of SSD and Flash Chip testers, Enviromental Chambers and Automatic handlers, Tanisys is equipped to handle all aspects of SSD testing and manufacturing.Tanisys has a comprehensive line of SSD testers ranging from the low-volume QA tester to the high-volume production testing.Tanisys headquarters in Austin, Texas, has direct offices in South Korea and global representatives strategically located in South East Asia,Taiwan and China.

Tanisys Product Line

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