SSD Environmental Test Chambers

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Neosem Technology provides a comprehensive line of environmental SSD chambers that are ideally suited for both laboratory and volume manufacturing applications. Engineered and built to provide long-term value and reliability for your environmental testing needs, our chambers are designed to manage airflow while maintaining accurate temperature gradients.

Neosem SX Series SSD test chambers are available as stand-alone systems, with optional multiple temperature zones, each with independent thermal controller systems. Our chambers can be configured to include Device Power Supplies (DPS’s) for Built In Self Test (BIST) applications, or our chambers can be fully integrated with SSD functional test systems for at-speed protocol testing (SAS 6G, SATA 12G, PCIe 3.0) in engineering or volume manufacturing applications.

 

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F-60B Production Test System

The F-60B is a high-density system with a small footprint that can be configured for SSD or PCIe devices. The system utilizes Neosem’s robust Andromeda operating software platform with a comprehensive library of standard tests.

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The F-60B production test system is designed to be a highly parallel, high performance and scalable test solution supporting low cost of ownership (LCOE) for SSD Products. The F-60B production test system supports a large number of SSD drives to be tested in parallel at their highest speeds. The systems flexibility and scalability allows multiples of sixty-four (64) SSD Drives of any Package/Protocol Type to be tested in parallel. The F-60B production test system use our revolutionary Carrier system to load the system for production test. With the numerous configurations and options available the F-60B is the right choice for applications such as Quality Assurance (QA), low volume ambient production test as well as for engineering lab environments. The F-60 Series is also available with a number of environmental chambers and material handlers to best fit your volume test and throughput needs.

  • Tailored to SSD or PCIe Testing with SAS, SATA, AHCI, NVMe and Serial interfaces
  • Programmable power margining per DUT with current and voltage measurement read-back
  • Turnkey solution, featuring Neosem ‘s Andromeda operating software
  • User-friendly GUI allows for easy test control (start/stop) and monitoring (status) of all DUT on one screen
  • Systems are customized for uniform airflow across individual PCIe form factors
  • Provides characterization data such as performance, measurement, throughput, IOPs, thermal and power consumption
  • GUI allows intuitive drill down monitoring from scripts level through DUT interface commands and down to bit level write and read operations
  • Comprehensive library of engineering, reliability, quality and production test scripts designed for HDD, SSD and PCIe devices

F-60E Environmental SSD Test System

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The F-60E SSD or PCIe environmental self-test system is based on the same platform and building blocks as Neosem’s field proven portfolio of full function test systems. It is optimized to run self-test routines from inside the device itself, power only applied, thereby allowing for a tester with greater port density, simplified operation and lower cost. This tester will start and manage the device tests and the environment temperature/humidity, as well as gather and organize test history and test results.

  • Tailored to testing with SSD or PCIe testing with SAS, SATA, AHCI, NVMe and Serial interfaces
  • Programmable power margining per DUT with current and voltage measurement read-back
  • Turnkey solution, featuring Neosem’s Andromeda operating software
  • User friendly GUI allows for easy test control (start/stop) and monitoring (status) of all Devices Under Test (DUT) on one screen
  • Provides characterization data such as performance, measurement, throughput, IOPs, thermal and power consumption
  • GUI allows intuitive drill down monitoring from scripts level through DUT interface commands and down to bit level write and read operations
  • Comprehensive library of engineering, reliability, quality and production test scripts designed for HDD, SSD and PCIe devices.

Enabled with our innovative “high density” technology, the Neosem line of thermal management chambers is attractive for installations where space constraints require a smaller footprint in your lab or on your manufacturing floor.

For more information on our line-up of Thermal Management Chambers and Systems please contact Neosem Technology

DOWNLOAD F-60B SSD Chamber Brochure (1MB)

DOWNLOAD F-60E SSD Chamber Brochure (1MB)

Contact Us

Neosem Technology (Austin)
11001 Lakeline Blvd.,
Bldg I, Suite 150
Austin, TX 78717
(512) 257-5000


Neosem Technology (San Jose)
1965 Concourse Dr.,
San Jose, CA 95131
(408) 643-7000
sales@neosemtech.com