Tanisys to demonstrate Engineering SSD Tester at Flash Memory Summit 2015

Posted by on Tuesday, August 4th, 2015 in News


August 4 ,2015 Austin Texas

Tanisys Technology Inc, the leader in SSD test solutions will demonstrate the company ’s 3rd generation Engineering SSD Test platform for PCIe solid state storage at the Flash Memory Summit schedule from August 11 to 13, 2015. This year the exhibition will be held at the Santa Clara Convention Center.


The SX3e+ is Tanisys Technology’s third generation SSD test system.Designed for SSD test from the ground up, the SX3e+ is optimized to meet the rapidly evolving requirements in the SSD market space.The unique architecture of the SX3e+ provides the flexibility to test all current SSD protocols – and – easily adapts to the addition of new protocols as they emerge.

In addition to complete protocol testing,the SX3e also fully supports testing Out-of-Band signal (DevSlp, WAKE,CLKREQ,…) requirements and serial communications standards, such as for SMBus, UART, and others. The SX3e+ also supports running the Storage Verification Framework (SVF) suite from OakGate Technologies.

“We are pleased that the new Tanisys SX3e+ Tester system has now been adopted by multiple SSD engineering labs around the globe and the industry is rapidly adopting Tanisys ‘s PCIe Testers for enterprise applications testing,” said DH Yeom, President and CEO, Tanisys Technology.

Tanisys SX3e+ SSD Tester is a new platform dedicated to test PCIe 3.0,AHCI, NVMe & SAS 3/6/12GBs with a quick change of Test Board (TB) enable our customers to fully develop,debug and qualify test flows for mass production or to perform as a QA and Validation test system. Tanisys Technology has been shipping the SX3e+ SSD Tester PCIe platforms with NVMe and AHCI support to customers worldwide since the middle part of this year.

Visitors to Booth #803 at Flash Memory Summit will see demonstration of other Tanisys Technology’s industry leading PCIe test platforms.

Founded in 1992, Tanisys Technology Inc develops, market, and support a family of high performance and cost effective SSD Storage and memory test system. Tanisys pioneered the first low cost ATE Class SSD tester in 2009. Since then, Tanisys SSD testers have become the standard for SSD and Flash manufacturing industry, holding more marketshare in SSD testers than any competitions.With its wide range of product lines of SSD and Flash Chip testers, Environmental Chambers and Automatic handlers, Tanisys is equipped to handle all aspects of SSD testing and manufacturing.Tanisys has a comprehensive line of SSD testers ranging from the low-volume QA tester to the high-volume production testing.

Call (512) 257-5000 for more information or visit www.neosemtech.com

Founded in 1992, Tanisys Technology Inc develops, market, and support a family of high performance and cost effective SSD Storage and Flash memory test system. Tanisys pioneered the first low cost ATE Class SSD tester in 2009. Since then, Tanisys SSD testers have become the standard for SSD and Flash manufacturing industry, holding more marketshare in SSD testers than any competitions.

With its wide range of product lines of SSD and Flash Chip testers, Enviromental Chambers and Automatic handlers, Tanisys is equipped to handle all aspects of SSD testing and manufacturing.Tanisys has a comprehensive line of SSD testers ranging from the low-volume QA tester to the high-volume production testing.Tanisys headquarters in Austin, Texas, has direct offices in South Korea and global representatives strategically located in South East Asia,Taiwan and China.

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