Tanisys to launch SSD Mini Chamber System at Flash Memory Summit 2015

Posted by on Friday, August 7th, 2015 in News

August 7, 2015

Tanisys Technology Inc, the leader in SSD test solutions will unveil the company ’s 3rd generation SSD Test Chamber for PCIe solid state storage at the Flash Memory Summit schedule from August 11 to 13, 2015. This year the exhibition will be held at the Santa Clara Convention Center.

The Tanisys SX3e-mc Environmental Mini-Chamber provides SSD testing over a wide temperature range in a compact tabletop chassis. Designed for SSD reliability and qualification environments, the SX3e‐mc combines the production-proven architecture of the Tanisys SX3 SSD test system with a fully featured chamber that takes up just over 1 square meter of laboratory bench space for at-temperature testing of up to 32 drives at a time.

SX3e-mc Mini Chamber

SX3e-mc Mini Chamber

By utilizing the exact same tester hardware and software as our larger production chambers,  the SX3e‐mc allows seamless transition from your engineering lab for small batch reliability testing all the way to your factory floor for High Volume Manufacturing.  And like all of the Tanisys Technology chamber system, the SX3e-mc also supports running the Storage Verification Framework (SVF) suite from OakGate Technologies,to provide industry leading RDT and life testing capabilities on up to 32 drives at a time.

At the heart of the SX3e-mc chamber is the Tanisys SX3e+ test system, which combines two Core Processor and  Protocol Boards, with an Independent Device Power Board to support testing all of the current SSD protocols, and provides the flexibility to adapt to future test needs. The DNA3 system architecture and infrastructure assures distributed processing, no bandwidth loss, and no signal fidelity loss when scaling from the smallest engineering station to the largest HVM environmental chamber.

Tanisys SX3e-mc system is a new platform dedicated to test PCIe 2.0, PCIe 3.0,AHCI, NVMe & SAS 3/6/12GBs with a quick change of Test Board ( TB) enable our customers to fully develop,debug and qualify test flows for SSD lab qualification or to perform as a QA test system.

Visitors to Booth # 803 at Flash Memory Summit will see demonstration of other Tanisys Technology’s industry leading SATA,SAS & PCIe test platforms.

Call (512) 257-5000 for more information or visit www.neosemtech.com

Founded in 1992, Tanisys Technology Inc develops, market, and support a family of high performance and cost effective SSD Storage and Flash memory test system. Tanisys pioneered the first low cost ATE Class SSD tester in 2011. Since then, Tanisys SSD testers have become the standard for SSD and Flash manufacturing industry, holding more marketshare in SSD testers than any competitions.

With its wide range of product lines of SSD and Flash Chip testers, Environmental Chambers and Automatic handlers, Tanisys is equipped to handle all aspects of SSD testing and manufacturing.Tanisys has a comprehensive line of SSD testers ranging from the low-volume QA tester to the high-volume production testing.Tanisys headquarters in Austin, Texas, has direct offices in South Korea and global representatives strategically located in South East Asia,Taiwan and China.

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